Maximizing mtDNA Testing Potential With the Generation of High-Quality mtGenome Reference Data

Fast, Spence A., Dover AFB DE; Just, Rebecca, Fort Detrick MD; Scheible, Melissa K., Rockville MD; Andreaggi, Kimberly S., Dover Air Force Base DE; Higginbotham, Jennifer L., Dover AFB DE; Lyons, Elizabeth A., Lansing MI; Bush, Jocelyn M., Columbus OH; Peck, Michelle A., The Hague NETHERLANDS; Ring, Joseph D., Dover AFB DE; Diegoli, Toni M., Arlington VA; Röck, Alexander W., 6020 Innsbruck AUSTRIA; Parson, Walther, Innsbruck AUSTRIA; Irwin, Jodi A., Quantico VA