Research & Education JFS ArticlesAAFS ConnectConference ProceedingsReference Series LibraryInternational Educational Outreach ProgramThe Application of Scanning Electron Microscopy and Energy Dispersive Spectroscopy for Forensic and Failure InvestigationsPresenting section:Engineering & Applied Sciences2012Wagner, Gregory J., Oak Ridge TN; Zimmerman, Bonnie, Oak Ridge TNView the paperEngineering & Applied Sciences