Research & Education JFS Articles AAFS Connect Conference Proceedings Reference Series Library International Educational Outreach Program Comparing X-Ray Diffractometry (XRD) and Fourier Transform Infrared (FTIR) Spectrometry for the Analysis of Forensic Evidence Presenting section: Criminalistics 2018 Kimble, Ke'La, Baton Rouge LA; Rowe, Walter F., Washington DC View the paper Criminalistics