Research & Education JFS ArticlesAAFS ConnectConference ProceedingsReference Series LibraryInternational Educational Outreach ProgramAn Evaluation of the Illumina® Infinium™ Omni Express Exome Bead Chip for Forensic TestingPresenting section:Criminalistics2020Davoren, Jon, Lorton VA; Vidoli, Giovanna M., Knoxville TN; Mundorff, Amy Z., Knoxville TNView the paperCriminalistics