Research & Education JFS Articles AAFS Connect Conference Proceedings Reference Series Library International Educational Outreach Program An Evaluation of the Illumina® Infinium™ Omni Express Exome Bead Chip for Forensic Testing Presenting section: Criminalistics 2020 Davoren, Jon, Lorton VA; Vidoli, Giovanna M., Knoxville TN; Mundorff, Amy Z., Knoxville TN View the paper Criminalistics