Research & Education JFS ArticlesAAFS ConnectConference ProceedingsReference Series LibraryInternational Educational Outreach ProgramExtracting Forensic Information From Biometric DevicesSession:General2005Geradts, Zeno J., Den Haag NETHERLANDS; Ruifrok, Arnout C., Den Haag NETHERLANDS; Bijhold, Jurrien, Den Haag AE NETHERLANDSView the paperGeneral