Research & Education JFS Articles AAFS Connect Conference Proceedings Reference Series Library International Educational Outreach Program How to Scan Hot Stuffs: Scanning Electron Microscopy Applied to Forensic Investigations Presenting section: Pathology/Biology 2013 Osculati, Antonio M.M., Pavia ITALY; Basso, Petra R., Varese ITALY; Congiu, Terenzio, Varese ITALY; Andrello, Luisa, Bellinzona SWITZERLAND View the paper Pathology/Biology