Using Kernel-Based Methods for Inferring the Source of Very Small Particles (VSPs) From Recovered Forensic Materials

Presenting section:
Criminalistics
Armstrong, Douglas E., Brookings SD; Neumann, Cedric, Brookings SD; Saunders, Christopher P., Brookings SD; Gantz, Donald T., Fairfax VA; Miller, John J., Fairfax VA; Stoney, David A., Chantilly VA